Optical 3D Surface Profiler "smartWLI Series"
Achieving high-precision on-machine measurement and inline evaluation through vertical scanning low-coherence interferometry!
The "smartWLI series" is a three-dimensional surface profiler (white light interferometer, optical three-dimensional surface shape and roughness meter) that utilizes vertical scanning low-coherence interferometry (CSI) developed by GBS Corporation. The optical three-dimensional surface profiler can non-contact measure surface characteristics such as unevenness, scratches, and seams in the manufacturing processes and quality inspections of precision machined parts like lens molds, automotive parts, electronic components, and functional materials. The vertical scanning low-coherence interferometry (CSI), which is the international standard for three-dimensional surface profile measurement ISO25178-6 (domestic standard JIS B0681-6), features high vertical (unevenness) sensitivity that is independent of the observation field (magnification of the interference objective lens). The "smartWLI series" includes measuring instruments required for inline inspection in manufacturing environments, on-machine measurement of large objects, and measurement of the inner walls of engine cylinders. Additionally, the industry-standard analysis software MountainsMap(R) is adopted.
- Company：キヤノンマーケティングジャパン
- Price：Other
